paper 150305041012

Published: 2015-07-09

Design of Evaluation Board with a Built-in 25 Gb/s PRBS Source for Testing High-frequency Probe

Yaw-Dong Wu,

Yaw-Dong Wu

National Kaohsiung University of Applied Sciences, Taiwan, R.O.C.

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Jau-Ji Jou,

Jau-Ji Jou

National Kaohsiung University of Applied Sciences, Taiwan

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Hong-Lu Lin,

Hong-Lu Lin

National Kaohsiung University of Applied Sciences, Taiwan

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Tien-Tsorng Shih,

Tien-Tsorng Shih

National Kaohsiung University of Applied Sciences, Taiwan, R.O.C.

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Wei Wang

National Kaohsiung University of Applied Sciences, Taiwan

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Proceedings of 2015 Photonics & Electromagnetics Research Symposium, Prague, July 6 - 9，Page(s)145-148

Abstract

In this paper, an evaluation board with a built-in 25 Gb/s PRBS source was de- veloped for testing high frequency probe (pogo pin) in time domain. The high frequency probes in semiconducting testing field are one of convincing contact elements selections. A commercial clock-data-recovery (CDR) chip was used to design the PRBS source. The 25 Gb/s PRBS signal with 14.2 ps rise time, 15.6 ps fall time, and 14.2 ps time jitter can be generated from our evalua- tion board. Some printed circuit board (PCB) layout techniques were used to design the 25 Gb/s evaluation board. The advantages of our 25 Gb/s evaluation board for testing high frequency probe have low cost, small size, and light weight.

Citation

Yaw-Dong Wu, Jau-Ji Jou, Hong-Lu Lin, Tien-Tsorng Shih, and Wei Wang, "Design of Evaluation Board with a Built-in 25 Gb/s PRBS Source for Testing High-frequency Probe," Proceedings of 2015 Photonics & Electromagnetics Research Symposium, Prague, July 6 - 9，Page(s)145-148

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