PhotonIcs and Electromagnetics Research Symposium,
also known as Progress In Electromagnetics Research Symposium
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Published: 2015-07-09
Numerical Modeling of Dielectric Properties of Silicon Phantoms for Microwave Imaging and Hyperthermia
By
Pavel Spurny,
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    Pavel Spurny

    Czech Technical University in Prague, Czech Republic

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David Vrba,
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    David Vrba

    Czech Technical University in Prague, Czech Republic

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Jan Vrba, Jr.,
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    Jan Vrba, Jr.

    Czech Technical University in Prague, Czech Republic

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Miroslav Wiewegh
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    Miroslav Wiewegh

    Czech Technical University in Prague, Czech Republic

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Progress In Electromagnetics Research, Vol. 185, 17-48, 2026
doi:10.2528/PIER26011404
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Abstract
We present a review of homogenization models of microwave wire media with different geometries. We begin with a simple (uniaxial) wire medium and then consider more complex types of wire media - double, triple, and interlaced wire media - which remain underexplored. We discuss boundary problems with wire media and the most important physical effects revealed using the reviewed homogenization models.
Citation
Pavel Spurny, David Vrba, Jan Vrba, Jr., and Miroslav Wiewegh, "Numerical Modeling of Dielectric Properties of Silicon Phantoms for Microwave Imaging and Hyperthermia," Proceedings of 2026 Photonics & Electromagnetics Research Symposium, Suzhou, China, 27 - 31 July
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