PhotonIcs and Electromagnetics Research Symposium,
also known as Progress In Electromagnetics Research Symposium
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Published: 2015-07-09
Conductor Loss Evaluation of Thin Microstrip Line with Various Copper Roughnesses
By
Ryosuke Suga,
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    Ryosuke Suga

    Aoyama Gakuin University, Japan

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Yasumasa Akatsuka,
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    Yasumasa Akatsuka

    Nippon Kayaku Co. Ltd., Japan

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Osamu Hashimoto,
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    Osamu Hashimoto

    Aoyama Gakuin University, Japan

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Kazuhiko Ishii,
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    Kazuhiko Ishii

    Nippon Kayaku Co. Ltd., Japan

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Tatsuya Suzuki,
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    Tatsuya Suzuki

    Aoyama Gakuin University, Japan

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Tomoki Uwano
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    Tomoki Uwano

    Aoyama Gakuin University, Japan

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Progress In Electromagnetics Research, Vol. 185, 17-48, 2026
doi:10.2528/PIER26011404
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Abstract
We present a review of homogenization models of microwave wire media with different geometries. We begin with a simple (uniaxial) wire medium and then consider more complex types of wire media - double, triple, and interlaced wire media - which remain underexplored. We discuss boundary problems with wire media and the most important physical effects revealed using the reviewed homogenization models.
Citation
Ryosuke Suga, Yasumasa Akatsuka, Osamu Hashimoto, Kazuhiko Ishii, Tatsuya Suzuki, and Tomoki Uwano, "Conductor Loss Evaluation of Thin Microstrip Line with Various Copper Roughnesses," Proceedings of 2026 Photonics & Electromagnetics Research Symposium, Suzhou, China, 27 - 31 July
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