PIERS 2019 in Xiamen
[EM Wave]

PhotonIcs & Electromagnetics Research Symposium
also known as Progress In Electromagnetics Research Symposium

PIERS 2019 in Xiamen, China, 17-20 December, 2019

Quick Links

PIERS Guidelines  
Paper Submission  
Session Organization  
Young Scientist Program  
PIERS Exhibition  
PIERS Shortcourse  
PIERS Gallery  
PIERS2019 Organization  
PIERS2019 Sponsors  
Author Login
Reviewer Login

PIERS 2019 Sponsors

Recent PIERS
PIERS2019 in Xiamen
PIERS2019 in Rome
PIERS2018 in Toyama
PIERS2017 in Singapore
PIERS2017 in St. Petersburg
PIERS2016 in Shanghai
PIERS2015 in Prague
PIERS2014 in Guangzhou
PIERS2013 in Stockholm
PIERS2013 in Taipei
PIERS2012 in Moscow
PIERS2012 in Kuala Lumpur
PIERS2011 in Suzhou
PIERS2011 in Marrakesh
PIERS2010 in Cambridge
PIERS2010 in Xi'an
PIERS2009 in Moscow
PIERS2009 in Beijing
PIERS2008 in Cambridge
PIERS2008 in Hangzhou
PIERS2007 in Prague
PIERS2007 in Beijing

Warning: include_once(../include/confPIERS.inc.php): failed to open stream: No such file or directory in /var/www/piers/public_html/piers2019Xiamen/include/mail.inc.php on line 2

Warning: include_once(): Failed opening '../include/confPIERS.inc.php' for inclusion (include_path='.:/usr/share/php') in /var/www/piers/public_html/piers2019Xiamen/include/mail.inc.php on line 2
PIERS2019 Xiamen Focus/Special Sessions  
5_FocusSession.SC5: Machine Learning for Inversion and Imaging 2
Organized by Mr. Dominique Lesselier (UMR8506 (CNRS, Centrale Supélec, University Paris-Sud), Université Paris-Saclay) and Prof. Xudong Chen (National University of Singapore)
Session's Information:
The session welcomes all papers that are related to learning approach to problems in inverse scattering, imaging, and remote sensing. The session aims at presenting frontier researches in the theories, computations, and applications of machine learning for solving electromagnetic inverse problems. All types of learning algorithms are welcomed: supervised and semi-supervised learning, unsupervised learning, and reinforcement learning. Applications include but not limited to microwave imaging, through-wall-imaging, subsurface detection, electric impedance or capacitance tomography, biomedical imaging, near-field optical imaging, non-destructive testing/evaluation, and remote sensing.
Organizer's Information:

  • Mr. Dominique Lesselier
    UMR8506 (CNRS, Centrale Supélec, University Paris-Sud), Université Paris-Saclay

  • Prof. Xudong Chen
    National University of Singapore

Warning: mysql_close() expects parameter 1 to be resource, null given in /var/www/piers/public_html/piers2019Xiamen/session.php on line 106

                                                                          Contact PIERS OFFICE: office@piers.org